X射线荧光光谱仪(XRF)

2015-11-23

X-射线荧光光谱仪(XRF),现有日本Rigaku公司生产的ZSX primus波长色散型XRF一台,及配套所必须的电源设备、冷循环水设备和前处理熔样机等。X射线荧光光谱分析技术制样简单、分析快速方便、应用广泛,可用于测定包括岩石、土壤、沉积物等在内的各种地质样品的化学组成。分析元素范围从Be(4)U(92),最常见的是用于主量元素分析,如SiO2Al2O3CaOFe2O3TK2OMgOMnONa2OP2O5TiO2LOI等元素。

The wavelength dispersion X-ray fluorescence spectrometer (XRF) is ZSX primus, made by Rigaku, Japan, with a set of instruments of electrical power unit, cold circulating water equipment and automatic fusion machine. XRF is widely used for geological element analysis, including rocks, soils, sediments, etc, which is simplicity and convenience of operation. Its analyzable elements range is from Be (4) to U (92). XRF is most common for the analysis of major elements, such as SiO2, Al2O3, CaO, Fe2O3T, K2O, MgO, MnO, Na2O, P2O5, TiO2 and LOI.